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eMetrology and Testing

October 23rd, 2017
Dear readers, The editors of the Metrology and Testing professional bulletin present the third issue of the eMetrology and Testing Bulletin bringing third more concise electronic version the printed bulletin.   We wish you pleasant reading...

eMetrology and Testing

July 12th, 2017
Dear readers, The editors of the Metrology and Testing professional bulletin present the second issue of the eMetrology and Testing Bulletin bringing second more concise electronic version the printed bulletin.   We wish you pleasant...

4th meeting of the Working Group on Standardization, Metrology and Conformity Assessment in the Russian Federation

May 22nd, 2017
On April 27, 2017, the 4th meeting of the Working Group on Standardization, Metrology and Conformity Assessment was held within the 18th meeting of the Intergovernmental Commission for Trade, Economic, Scientific and Technical Cooperation (IC) between the...

World metrology day

May 17th, 2017
May 20 is World Metrology Day, commemorating the anniversary of the signing of the Metre Convention in 1875. This treaty provides the basis for a coherent measurement system worldwide that underpins scientific discovery and innovation, industrial...

Signing of a Memorandum of Understanding between the Office of Standards, Metrology and Testing of the Slovak Republic and the State Committee for Standardization of the Republic of Belarus

May 5th, 2017
On April 27, 2017, the Memorandum of Understanding on Cooperation in Standardization, Metrology and Conformity Assessment between the Office of Standards, Metrology and Testing of the Slovak Republic and the State Committee for Standardization of the...

StandarDays2017

March 22nd, 2017
StandarDays is a two day information session aimed at newcomers to European standardization, as well as those who would like to understand the CEN and CENELEC systems better. StandarDays gives you the opportunity to: participate in a 2-day training...

World metrology day

May 17th, 2017
May 20 is World Metrology Day, commemorating the anniversary of the signing of the Metre Convention in 1875. This treaty provides the basis for a coherent measurement system worldwide that underpins scientific discovery and innovation, industrial...

IEC Young Professionals workshop

February 28th, 2017
International Electrotechnical Committee IEC encourages the involvement of young experts in standardization and offers to the national committees an opportunity to choose two young professionals who attend the IEC 81th General Meeting. The workshop...

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of Standards, Metrology
and Testing

 Ing. Pavol Pavlis

 

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